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 2011-2012

 

1.     V.P. Gavrilenko, E. Oks, Nonexistence of a local suppression in the ionization of hydrogen atoms by a low-frequency laser field of arbitrary strength, Canadian Journal of Physics, v. 89, 849-855 (2011).

2.     M.N. Filippov, V.P. Gavrilenko, M.V. Kovalchuk, V.B. Mityukhlyaev, Yu.V. Ozerin, A.V. Rakov, V.V. Roddatis, P.A. Todua, V.L. Vasiliev, Reference material for transmission electron microscope calibration, Measurement Science and Technology,

      v. 22 (2011), 094014 (5 pp.)

3.     V.P. Gavrilenko, P.A. Todua, Dimensional Metrology of Low-Dimension Systems, In: Graphene 2012 International Conference (Brussels, Belgium, April 10-13, 2012), Book of abstracts of presentations of the members of delegation of the Ministry of Education and Science of the Russian Federation, pp. 82-84.

4.     P.A. Todua, V.P. Gavrilenko, Nanometrology and Standardization for Nanotechnologies, In: Graphene 2012 International Conference (Brussels, Belgium, April 10-13, 2012), Book of abstracts of presentations of the members of delegation of the Ministry of Education and Science of the Russian Federation, pp. 86-88.

5.     .. , .. , , 5- (, , 4-7 2012 .), . , . 17.

6.     M.N. Filippov, V.P. Gavrilenko, M.V. Kovalchuk, V.B. Mityukhlyaev, A.V. Rakov,  P.A. Todua, V.L. Vasiliev, New reference material for transmission electron microscope calibration, SPIE Proceedings, v. 8466, paper 8466-11 (7 pages).

 

 

 

1.     : Metrology and Standards for Nanotechnologies. : Humboldt Colloquium The Role of Fundamental Sciences in Society (Moscow, Russia, 31 May 2 June 2012) on Occasion of the German-Russian Year of Science 2011/2012 and the Germany Year in Russia / Russia Year in Germany 2012/2013.

 

2.     : . : 5- (, , 4-7 2012 .).

 

3.     Dimensional Metrology of Low-Dimension Systems. : II   Graphene 2012 (Brussels, Belgium, April 10-13, 2012).

 

4.     Nanometrology and Standardization for Nanotechnologies. : II   Graphene 2012 (Brussels, Belgium, April 10-13, 2012).

 

 

,

 

1.     V.P. Gavrilenko, Yu.A. Novikov, A.V. Rakov, P.A. Todua, Metrology and standardization for nanotechnologies, In: Intern. Conf. Electron Microscopy and Multiscale Modeling, Russia, 2007, Proceeding of the EMMM-2007 Intern. Conf., American Institute of Physics, pp. 286-297 (2008).

2.     V.P.Gavrilenko, V.B.Mityuhlyaev, Yu.A.Novikov, Yu.V.Ozerin,  A.V.Rakov, P.A. Todua, Test object of the linewidth with a trapezoidal profile and three certified sizes for an SEM and AFM, Measurement Science and Technology, vol. 20, pp. 084022-1 084022-7 (2009).

3.     V.P. Gavrilenko, Yu.A.Novikov, A.V.Rakov, P.A. Todua, Nanoscale dimensional metrology in Russia, In: Proceedings of SPIE, vol. 7405, pp. 740504-1 740504-8 (2009).

4.     V.P. Gavrilenko, M.N.Filippov, Yu.A.Novikov, A.V.Rakov, P.A. Todua, Russian Standards for Dimensional Measurements for Nanotechnologies, In: Proceedings of SPIE, vol. 7378, pp. 737812-1 737812-8 (2009).

  1. M.N.Filippov, V.P.Gavrilenko, M.V.Kovalchuk, V.B.Mityukhlyaev, Yu.V.Ozerin, A.V.Rakov, V.V.Roddatis, P.A. Todua, A.L.Vasiliev, Reference material for transmission electron microscope calibration, Measurement Science and Technology, vol. 22, pp.094014-1 094014-5 (2011).

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